Iijima Y., Saitoh T., Kakimoto K., Sutoh Y.(ysutoh@fujikura.co.jp), Kaneko N.
Saitoh T., Teranishi R., Izumi T., Shiohara Y., Fuji H.(hfuji@istec.or.jp), Yamada Y., Matsuda J., Yajima A., Nakaoka K., Kito Y.
Schmidt W., Han Z., Wang L., Chen S., Du P., Wang S.S.(wangsansheng@tsinghua.org.cn), Neumuller H.W.
Osamura K., Semerad R., Itoh K., Prusseit W., Kiyoshi T., Sugano M.(sugano@kuee.kyoto-u.ac.jp)
Ключевые слова: HTS, YBCO, REBCO, REBCO, coated conductors, substrate Hastelloy, tensile tests, fracture behavior, ISD process, buffer layers, mechanical properties, critical current, strain effects, stress effects, microstructure, quench properties, fabrication, experimental results, critical caracteristics
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Ma B., Koritala R.E., Fisher B.L., Dorris S.E., Miller D.J., Balachandran U., Maroni V.A., Uprety K.K.
Barnes P.N., Sathiraju S.(srinivas.sathiraju@wpafb.af.mil), Varanasi C.(chakrapani.varanasi@wpafb.af.mil), Wheeler R.(robert.wheeler@wpafb.af.mil)
Ключевые слова: HTS, YBCO, coated conductors, substrate Hastelloy, buffer layers, IBAD process, microstructure, texture, fabrication
Ключевые слова: HTS, coated conductors, buffer layers, ISD process, surface, microstructure, substrate Hastelloy, PLD process, thickness dependence, angular dependence, fabrication
Muroga T., Nagaya S., Kashima N., Izumi T., Shiohara Y., Yamada Y., Miyata S., Watanabe T.(t-nabe@istec.or.jp), Niwa T.(Niwa.Toshiharu@chuden.co.jp), Mori M.(Mori.Masami2@chuden.co.jp)
Ключевые слова: HTS, YBCO, coated conductor modules, CVD process, multistage process, substrate Hastelloy, microstructure, texture, growth rate, fabrication
Muroga T., Nagaya S., Kashima N., Izumi T., Shiohara Y., Watanabe T., Yamada Y., Miyata S., Shikimachi K.
Arendt P.N., Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Coulter J.Y., Maiorov B., Serquis A., Willis J.O., Maley M.P., Civale L.(lcivale@lanl.gov)
Arendt P.N., Foltyn S.R., Jia Q.X., Wang H., MacManus-Driscoll J.L., Coulter J.Y., Civale L., Maiorov B., Serquis A., Willis J.O., Jaime M., Maley M.P.
Jiang Z., Iijima Y., Saitoh T., Kakimoto K., Amemiya N.(ame@rain.dnj.ynu.ac.jp)
Ключевые слова: HTS, YBCO, coated conductors, IBAD process, PLD process, substrate Hastelloy, ac losses, experimental results, fabrication
Saitoh T., Kakimoto K., Iijima Y.(ijm@rd.fujikura.co.jp), Sutoh Y., Ajimura S.
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, IBAD process, PLD process, substrate Hastelloy, reel-to-reel process, fabrication, status
Muroga T., Shiohara Y., Watanabe T., Kato T., Yamada Y., Hirayama T., Iwai H.(iwai@istec.or.jp), Miyata S.
Ma B., Welp U., Gray K.E., Uprety K.K., Veal B.W., Claus H.(claus@anl.gov), Paulikas A.P., Vlasko-Vlasov V.K.
Yasuda K., Muranaka K., Fujino K., Ohmatsu K.(ohmatsu-kazuya@sei.co.jp), Konishi M.
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